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This press release is an English version of the previously published Swedish version, which has interpretive precedence.
Smoltek Nanotech Holding AB (publ) ("Smoltek" or "the Company") announces that the subsidiary Smoltek Semi has cleared a significant milestone in the development of next-generation CNF-MIM capacitors. Samples from the latest prototype generation, fabricated with an advanced dielectric stack composed of zirconium oxide (ZrO₂) and aluminum oxide (Al₂O₃) have demonstrated exceptional stability under both temperature and voltage stress.
"This is a breakthrough in our CNF-MIM performance. The combination of CNF electrodes with a ZrO₂/Al₂O₃ stack, not only leverages the proven reliability of DRAM-grade dielectrics but also delivers exceptional TCC and VCC characteristics that outperforms what's currently offered by the ultra-thin MLCCs being used as landside decoupling capacitors in high-end processors", Dr. Farzan Ghavanini, CTO at Smoltek states.
Key Performance Highlights:
- Thermal Stability (TCC): The tested capacitors maintained robust performance up to 125°C, exhibiting only ~2.5% change in capacitance from room temperature (22°C). No signs of degradation were observed, underscoring the durability and reliability of the dielectric stack under extended thermal stress.
- Voltage Stability (VCC): When tested across a bipolar voltage range of ±4V, the devices only showed as little as ~3% change in capacitance, further validating the dielectric integrity. At a 2V operating range - the target rating voltage representing the landside application - the capacitance shift was contained within ~1%, highlighting the suitability of these devices for high-performance systems.
A Leap Forward in Smoltek's CNF-MIM Technology
The advanced dielectric stack, composed of zirconium oxide (ZrO₂) and aluminum oxide (Al₂O₃), that Smotek Semi are using in the prototypes is the same stack used in the charge storage capacitor of most advanced DRAM technologies.
In the next step, Smolteks CNF-MIM capacitors will undergo extensive accelerated life testing to further validate their long-term reliability under operating conditions.
About the test
TCC (Temperature Coefficient of Capacitance) refers to the change in capacitance of a capacitor over a temperature range, while VCC (Voltage Coefficient of Capacitance) refers to the change in capacitance under applied DC voltage. Understanding both is crucial for capacitor selection and application, especially in circuits where temperature or voltage variations can affect performance.